Joffray Guillory, Maylis Teyssendier de la Serve, Daniel Truong, Christophe Alexandre, Jean-Pierre Wallerand. Uncertainty Assessment of Optical Distance Measurements at Micrometer Level Accuracy for Long-Range Applications.
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2019, 68 (6), pp.2260-2267.
⟨10.1109/TIM.2019.2902804⟩.
⟨hal-02448852⟩